首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Charge Pumping by Contact Electrification Using Electrostatic Force Microscopy in Bi- and Trilayered MoS2 Nanosheets
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Charge Pumping by Contact Electrification Using Electrostatic Force Microscopy in Bi- and Trilayered MoS2 Nanosheets

机译:使用静电力显微镜在Bi-and Trilayered MOS2纳米片中的静电力显微镜电荷泵送

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Pumping charges into nanostructures by contact electrification is important for controlling and manipulating a device functionality in tribotronics. This study demonstrates a controlled charge transfer by contact electrification on a few-layered MoS2 nanosheet obtained by a chemical vapor deposition process. Nucleation sites present in the MoS2 nanosheets with sharp-tip features are used to transfer the charge between conducting tip and MoS2 nanosheets during contact electrification. The biased tip touching nucleation site pumps charges on the nanosheets, resulting in sharp change in contrast during dynamic electrostatic force microscope (EFM) scanning. A systematic analysis of charge transfer is performed by studying the phase and amplitude changes in EFM mode and surface potential change in Kelvin probe force microscope (KPFM) mode. Charge pumping is achieved by controlling tip bias, tip lift height, and scan rate. The charge density on the nanosheets is increased by raising the tip bias. On the contrary, the charge density decreases as the tip lift height is increased. The tip proximity to the nucleation site is used to control the transfer of charges pumped into the MoS2 nanosheet. The sustenance of pumped charges in the nanosheet is important for potential applications of 2D materials. Charge diffusion between MoS2 nanosheets and the Si/SiO2 substrate after charge pumping is studied by monitoring the time-dependent phase shift in EFM and surface potential in KPFM modes, and charge decay times of 6.9 and 7.5 h, respectively, are estimated. Controlled charge pumping through contact electrification in MoS2 can provide ample opportunity to build a new class of two-dimensional (2D) MoS2-based tribotronic devices.
机译:在摩擦电子学中,通过接触带电将电荷泵入纳米结构对于控制和操纵设备功能非常重要。本研究证明了通过化学气相沉积工艺获得的多层MoS2纳米片上的接触带电控制电荷转移。具有尖尖特征的MoS2纳米片中的成核位点用于在接触带电期间在导电尖端和MoS2纳米片之间转移电荷。在动态静电显微镜(EFM)扫描过程中,偏置尖端接触成核位置会在纳米片上泵送电荷,导致对比度急剧变化。通过研究EFM模式下的相位和振幅变化以及开尔文探针力显微镜(KPFM)模式下的表面电位变化,对电荷转移进行了系统分析。电荷泵是通过控制尖端偏置、尖端提升高度和扫描速率来实现的。通过提高尖端偏压,纳米片上的电荷密度增加。相反,电荷密度随着尖端提升高度的增加而降低。尖端靠近成核位置用于控制泵入MoS2纳米片的电荷转移。纳米片中泵送电荷的维持对于二维材料的潜在应用非常重要。通过监测EFM中随时间变化的相移和KPFM模式下的表面电位,研究了MoS2纳米片和Si/SiO2衬底之间电荷泵浦后的电荷扩散,并估算了电荷衰减时间分别为6.9和7.5小时。通过MoS2中的接触带电来控制电荷泵送,可以为构建基于MoS2的新型二维摩擦电子学器件提供充分的机会。

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