Automated defect identification from carrier fringe patterns using Wigner-Ville distribution and a machine learning-based method

摘要

The paper presents a method for automated defect identification from fringe patterns. The method relies on computing the fringe signal's Wigner-Ville distribution followed by a supervised machine learning algorithm. Our machine learning approach enables robust detection of fringe pattern defects ofvaried shapes and alleviates the limitations associated with thresholding-based techniques that require careful control of the threshold parameter. The potential of the proposed method is demonstrated via numerical simulations to identify different types of defect patterns at various noise levels. In addition, the practical applicability of the method is validated by experimental results. (C) 2021 Optical Society of America