SICK's Deep Learning suite for simplified AI inspection

摘要

SICK launches a suite of Deep Learning apps and services to simplify machine vision quality inspection for challenging components, assemblies, surfaces or food produce, especially those that have previously defied automation and remained distinguishable only by human inspection. The suite radically reduces set-up time and cost by enabling AI image classification to run directly onboard SICK smart devices. Programmable SICK devices take decisions automatically using specially-optimised neural networks, and run accurate and reliable inspections that would have previously been extremely challenging or simply impossible to achieve in high-speed automated processes.