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AFM characterization of cellulose nanocrystal height and width using internal calibration standards

机译:AFM使用内部校准标准表征纤维素纳米晶体高度和宽度的特征

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A variety of models have been suggested for the cross-sectional shape and dimensions of cellulose nanocrystals (CNCs). Although many studies report measurements of CNC width (from transmission electron microscopy, TEM) and height (from atomic force microscopy, AFM), few have measured both cross-sectional dimensions for the same CNC sample and the same particles. Previous work has demonstrated that the TEM width is approximately twice the AFM height, a result that was explained by lateral aggregation of CNCs. Here we examine this question in more detail by measuring both CNC width and height by a single technique, AFM. The ability to measure both cross-sectional dimensions was facilitated by several factors: access to a fractionated CNC sample with few agglomerated particles, AFM imaging at low applied force with a small, nominal probe radius and in situ calibration of the AFM probe radius using co-deposited gold nanoparticles (AuNPs). Two sizes of AuNPs provided optimal calibration of the tip radius and allowed internal validation of the approach. The results show that the CNC width/height ratio covers a relatively wide range with a larger variation in width than height. The ratios indicate that approximately a third of the particles adsorb with their shorter cross-sectional side on the surface. A fraction of CNCs (28%) have an approximately symmetric cross-section whereas the remainder are asymmetric with one axis that is 2-3 times longer than the other. The results are consistent with a combination of laterally aggregated CNCs that cannot be resolved as individual particles and CNC particles that are comprised of multiple crystallites. This has important implications for applications in which the particle length/cross-section determines the CNC properties. Graphic abstract
机译:对于纤维素纳米晶体(CNC)的横截面形状和尺寸,人们提出了多种模型。尽管许多研究报告了CNC宽度(来自透射电子显微镜,TEM)和高度(来自原子力显微镜,AFM)的测量,但很少有研究同时测量了相同CNC样品和相同颗粒的横截面尺寸。以前的研究表明,TEM宽度大约是AFM高度的两倍,这一结果可以用CNC的横向聚集来解释。在这里,我们通过使用AFM这一单一技术测量CNC的宽度和高度来更详细地研究这个问题。测量两个横截面尺寸的能力是由以下几个因素促成的:获得含有少量团聚颗粒的分馏CNC样品、在小标称探针半径的低作用力下进行AFM成像,以及使用共沉积金纳米颗粒(AUNP)对AFM探针半径进行原位校准。两种尺寸的AUNP提供了尖端半径的最佳校准,并允许对该方法进行内部验证。结果表明,CNC宽高比覆盖范围相对较广,宽度变化大于高度变化。这些比率表明,大约三分之一的颗粒以其较短的横截面侧吸附在表面上。一小部分CNC(28%)的横截面近似对称,而其余CNC的横截面不对称,一个轴比另一个轴长2-3倍。结果与不能分解为单个颗粒的横向聚集CNC和由多个微晶组成的CNC颗粒的组合一致。这对于颗粒长度/横截面决定CNC特性的应用具有重要意义。图形摘要

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