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首页> 外文期刊>Analytical chemistry >Detection of High-Explosive Materials within Fingerprints by Means of Optical-Photothermal Infrared Spectromicroscopy
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Detection of High-Explosive Materials within Fingerprints by Means of Optical-Photothermal Infrared Spectromicroscopy

机译:通过光学光热红外光谱法检测指纹内的高爆炸材料

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摘要

As we live under a constant threat of global terrorism, the effective detection of highly energetic materials is one of the critical procedures needed at a variety of locations, including airports, border checkpoints, and entrances to high-security buildings. In this work, the application of optical-photothermal infrared (O-PTIR) spectromicroscopy for the detection of highly explosive materials within fingerprints is described. High-explosive (HE) materials (e.g., PETN, RDX, C-4, or TNT) were used to prepare contaminated fingerprints. These were subsequently deposited on various objects, including microscopic glass slides, a table, a mug, etc. Samples deposited on glass slides were directly sent for analyses; for other samples, adhesive tapes were used to lift off fingermarks. In cases of difficulty in locating fingerprints, additional powders were used to enhance their visibility. Experiments were performed with a mIRage IR microscope working in a noncontact, far-field reflection mode, offering submicron IR spectroscopy and imaging. Fast imaging (several characteristic absorbances were selected for every substance of interest) was used to locate "suspicious" particles among various residues present in fingerprints. Subsequently, spectra were collected for those particles. Reflection mode O-PTIR spectra taken from powdered and nonenhanced fingerprints were of comparable quality to transmission mode FTIR spectra collected for pure HEs. On the basis of the performed experiments, we consider O-PTIR spectromicroscopy to open a new avenue for the nondestructive, efficient, and reliable analysis of exogenous substances deposited within fingerprints. The real significance of O-PTIR is in its ability to deliver high-quality, spatially resolved FTIR transmission-like spectra below the diffraction limit of infrared wavelengths, doing so in an easy-to-use reflection (far-field) mode. Collected spectra are also searchable and interpretable in both commercial and institutional IR databases without mathematical modeling.
机译:由于我们生活在全球恐怖主义的不断威胁下,有效检测高度充电能材料是各种地点所需的关键程序之一,包括机场,边界检查点和高安全性建筑的入口。在这项工作中,描述了光学光热红外(O-PTIR)光谱法在指纹内检测高爆炸材料的应用。使用高爆炸(例如,佩特,RDX,C-4或TNT)来制备受污染的指纹。随后将它们沉积在各种物体上,包括微观玻璃载玻片,表,杯子等。直接送到玻璃载玻片上的样品进行分析;对于其他样品,使用粘合剂剥离Fingermarks。在定位指纹难度的情况下,使用额外的粉末来增强它们的可见性。用在非接触,远场反射模式下工作的幻影IR显微镜进行实验,提供亚微米光谱和成像。使用快速成像(针对每个物质的几种感兴趣的吸光度)用于在指纹存在的各种残基中定位“可疑”颗粒。随后,为那些颗粒收集光谱。反射模式从粉末和非肤色指纹采集的O-PTIR光谱对纯HES收集的传输模式FTIR光谱具有相当的质量。在进行所进行的实验的基础上,考虑到O-PTIR光谱分析,以开辟沉积在指纹内的外源物质的非破坏性,高效,可靠分析的新途径。 O-PTIR的实际意义在其提供高质量的空间解决的FTIR透射频谱下方的能力,低于红外波长的衍射极限,在易于使用的反射(远场)模式下这样做。收集的光谱也是可搜索的,并且在商业和机构IR数据库中也可以搜索和解释,而无需数学建模。

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