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Ag:SiOxNy-Based Bilayer ReRAM Structure with Self-Limiting Bidirectional Threshold Switching Characteristics for Cross-Point Array Application

机译:AG:基于SiOxny的双层reram结构,具有自限制双向阈值切换特性,用于交叉点阵列应用

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摘要

We fabricate a Pt/Ag:SiOxNy/Ti programmable metallization cell exhibiting bidirectional threshold switching (TS) or nonvolatile resistive switching (RS) characteristics through a simple thermal annealing process. The cell composed of pristine Ag:SiOxNy layers showed self-limiting TS characteristics with high selectivity and extremely low OFF currents, whereas the same cell showed typical RS characteristics after thermal annealing at 250 degrees C. The operating mechanism was investigated using scanning transmission electron microscopy and X-ray photoelectron spectroscopy. Next, a Ag:SiOxNy-based one selector-one resistor device was fabricated by employing both TS and RS characteristics in a single cell, which exhibited excellent self-rectifying memory performance.
机译:我们通过简单的热退火工艺制造具有双向阈值开关(TS)或非易失性电阻开关(RS)特性的PT / AG:SiOxNy / Ti可编程金属化电池。 由原始AG组成的细胞:SiOxny层显示自限制TS特性,具有高选择性和极低的电流,而在250摄氏度下热退火后,相同的电池显示出典型的RS特性。使用扫描透射电子显微镜研究操作机构 和X射线光电子能谱。 接下来,通过在单个电池中采用TS和RS特性来制造基于AG:SiOxny的一个选择器 - 一个电阻器件,这表现出优异的自整流存储器性能。

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