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Facile and Reversible Carrier-Type Manipulation of Layered MoTe2 Toward Long-Term Stable Electronics

机译:分层MOTE2对长期稳定电子产品的便利和可逆载体型操纵

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摘要

Flexible manipulation of the carrier transport behaviors in two-dimensional materials determines their values of practical application in logic circuits. Here, we demonstrated the carrier-type manipulation in field-effect transistors (FETs) containing alpha-phase molybdenum ditelluride (MoTe2) by a rapid thermal annealing (RTA) process in dry air for hole-dominated and electron-beam (EB) treatment for electron-dominated FETs. EB treatment induced a distinct shift of the transfer curve by around 135 V compared with that of the FET-processed RTA treatment, indicating that the carrier density of the EB-treated FET was enhanced by about 1 order of magnitude. X-ray photoelectron spectroscopy analysis revealed that the atomic ratio of Te decreased from 66.4 to 60.8% in the MoTe2 channel after EB treatment. The Fermi level is pinned near the new energy level resulting from the Te vacancies produced by the EB process, leading to the electron-dominant effect of the MoTe2 FET. The electron-dominated MoTe2 FET showed excellent stability for more than 700 days. Thus, we not only realized the reversible modulation of carrier-type in layered MoTe2 FETs but also demonstrated MoTe2 channels with desirable performance, including long-term stability.
机译:灵活操作二维材料中的载波运输行为决定了它们在逻辑电路中的实际应用的值。在这里,我们证明了通过在干燥空气中的快速热退火(RTA)工艺在含有α-相钼的晶体管(FET)的现场效应晶体管(FET)中的载流子型操纵,用于空气主导的和电子束(EB)处理用于电子主导的FET。与FET处理的RTA处理相比,EB治疗诱导转移曲线的明显偏移约135V,表明EB处理的FET的载流子密度增强了约1个级。 X射线光电子体光谱分析显示,EB治疗后,TE的原子比率从Mote2通道中的66.4%降低至60.8%。 FERMI水平靠近由EB过程产生的TE空缺导致的新能量水平附近,导致MOTE2 FET的电子显性效果。电子主导的Mote2 FET显示出优异的稳定性超过700天。因此,我们不仅实现了层状的Mote2 FET中载体类型的可逆调制,而且还证明了具有所需性能的Mote2通道,包括长期稳定性。

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