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首页> 外文期刊>ACS nano >Tuning and Probing the Distribution of Cu+ and Cu2+ Trap States Responsible for Broad-Band Photoluminescence in CuInS2 Nanocrystals
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Tuning and Probing the Distribution of Cu+ and Cu2+ Trap States Responsible for Broad-Band Photoluminescence in CuInS2 Nanocrystals

机译:调整和探测Cu +和Cu2 +陷阱状态的分布,负责Cuins2纳米晶体中的宽带光致发光

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The processes that govern radiative recombination in ternary CuInS2 (CIS) nanocrystals (NCs) have been heavily debated, but recently, several research groups have come to the same conclusion that a photoexcited electron recombines with a localized hole on a Cu-related trap state. Furthermore, it has been observed that single CIS NCs display narrower photoluminescence (PL) line widths than the ensemble, which led to the conclusion that within the ensemble there is a distribution of Cu-related trap states responsible for PL. In this work, we probe this trap-state distribution with in situ photoluminescence spectroelectrochemistry. We find that Cu2+ states result in individual "dark" nanocrystals, whereas Cu+ states result in "bright" NCs. Furthermore, we show that we can tune the PL position, intensity, and line width in a cyclic fashion by injecting or removing electrons from the trap-state distribution, thereby converting a subset of "dark" Cu2+ containing NCs into "bright" Cu+ containing NCs and vice versa. The electrochemical injection of electrons results in brightening, broadening, and a red shift of the PL, in line with the activation of a broad distribution of "dark" NCs (Cu2+ states) into "bright" NCs (Cu+ states) and a rise of the Fermi level within the ensemble trap-state distribution. The opposite trend is observed for electrochemical oxidation of Cu+ states into Cu2+. Our work shows that there is a direct correlation between the line width of the ensemble Cu+/Cu2+ trap-state distribution and the characteristic broad-band PL feature of CIS NCs and between Cu2+ cations in the photoexcited state (bright) and in the electrochemically oxidized ground state (dark).
机译:在三元Cuins2(CIS)纳米晶体(NCS)中治理辐射重组的方法严重争论,但最近,几个研究组已经得出相同的结论,即与Cu相关陷阱状态的局部孔的光透射电子重新组合。此外,已经观察到,单个顺式NCS显示比集合体更窄的光致发光(PL)线宽,这导致了集合内的结论,该结论是CU相关陷阱状态的分布负责PL。在这项工作中,我们用原位光致发光光谱电化学探测该陷阱状态分布。我们发现CU2 +状态导致单个“暗”纳米晶体,而CU +状态导致“明亮”NCS。此外,我们表明我们可以通过从陷阱状态分布注入或移除电子来调节PL位置,强度和线宽,从而将含有NCS的“暗”CU2 +的子集转换为“明亮”CU +的子集NCS和反之亦然。电子的电化学喷射导致PL的亮起,展大和红色偏移,符合激活“暗”NCS(CU2 +状态)进入“明亮”NCS(CU +状态)和升高的激活集合陷阱状态分布中的费米水平。将Cu +状态的电化学氧化成Cu2 +的电化学氧化观察到相反的趋势。我们的工作表明,集合Cu + / Cu2 +陷阱状态分布的线宽与CIS NCS的特征宽带PL特征以及光透射状态(明亮)和电化学氧化的CI2 +阳离子之间存在直接相关性之间的直接相关性地面(黑暗)。

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