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A 0.7 V 12b 160MS/S 12.8fJ/conv. Calibration-free Pipelined-SAR ADC in 28nm CMOS with Digital Amplifier Technique

机译:0.7 V 12b 160ms / s 12.8fj / conv。 使用数字放大器技术的28nm CMOS的无校准管道-SAR ADC

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摘要

We propose a calibration-free 0.7V 12b 160MS/s Pipelined-SAR ADC with digital amplifier (DA) technique [1]. DA cancels out all errors of the low-gain amplifier by feedback based on successive approximation (SA). Errors are detected by judging virtual ground polarity and canceled out by a C-DAC. The amplification accuracy is determined by the C-DAC LSB step and irrelevant to the intrinsic gain, and thus suitable for scaled CMOS. To further enhance the PVT tolerance of the ADC, look-ahead SAR and time-based current generation techniques are also introduced. The ADC is two-way interleaved and designed in 28nm CMOS. Without any calibration, SNDR of 61.1dB is achieved at Nyquist, consequently achieving FoM of 12.8fJ/conv. To the author's knowledge, this is over 3x improvement compared with the conventional calibration-free pipelined/pipelined-SAR ADCs with fs>50MS/s and SNDR>56dB.
机译:我们提出了一种无校准的0.7V 12b 160ms / s管式SAR ADC,具有数字放大器(DA)技术[1]。 根据连续近似(SA),通过反馈取消低增益放大器的所有错误。 通过判断虚拟地极性来检测错误并通过C-DAC取消。 扩增精度由C-DAC LSB步骤确定并与内在增益无关,因此适用于缩放CMOS。 为了进一步增强ADC的PVT公差,还引入了远程SAR和基于时间的当前产生技术。 ADC是双向交错和设计成28nm CMOS。 没有任何校准,在奈奎斯特实现61.1dB的SNDR,因此实现了12.8FJ / CANC的FOM。 对于作者的知识,与FS> 50ms / s和SNDR> 56dB的传统无需流水线/流水线-SAR ADC相比,这超过了3x改进。

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