Use of an FTIR Spectrometer to Characterize the Spectral Output of a Near-Infrared Diode Laser

摘要

Characterizing the spectral out-put of a diode laser requiresmore than simply measuringthe center wavelength witha wavemeter. The distribution of energybetween different modes will be affectedby temperature and current and maychange randomly. FTIR instruments arewell suited to studying this, combininghigh resolution and rapid measurementwith their extremely precise wavenum-ber scale derived from the internal HeNelaser. Their high sensitivity allows weaksidebands to be observed. This article illus-trates the use of the Frontier" FTIR spec-trometer (PerkinElmer, Shelton, CT) to characterize the spectral output of a near-infrared (NIR) diode laser operat-ing nominally at 785 nm with a peak width of 0.26 nm.