A method of the projection pattern control for 3D image measurement

摘要

Until now, many thing 3-D image measurement techniques have been proposed. The measurement which projects a projection pattern is also one of them. However, if measurement environment and a measurement object change, the accuracy of measurement will become bad or the measurement will become impossible in the case of the fixed measurement parameter is used. In order to solve the above-mentioned problem a technique is proposed to control the size and the intensity distribution of the projection pattern. If the optimum projection pattern can be projected according to a measurement scene, more active 3-D image measurement will be attained. This paper describes mainly the technique of the intensity control of a projection pattern automatically.