Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections

摘要

National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 Precision tests verify the do equivalent cir-cuit used by Ricketts and Kemeny to de-scribe a quantum Hail effect device in terms of electrical circuit elements. The tests employ the use of cryogenic current comparators and the doublcfseries and triple-series connection techniques of Delahaye. Verification of the dc equivalent circuit in double-series and triple-series connections is a necessary step in develop- ing the ac quantum Hall effect as ari .intrin-sic standard of resistance.