首页> 外文期刊>Journal of the Optical Society of America, B. Optical Physics >Integrable all-optics NOT gate using nonlinear photonic crystal MZI for photonic integrated circuit
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Integrable all-optics NOT gate using nonlinear photonic crystal MZI for photonic integrated circuit

机译:可集成的全光学不使用非线性光子晶体MZI用于光子集成电路的栅极

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A silicon photonic crystal (PhC)-based nonlinear Mach-Zehnder interferometer (NMZI) is used to design a new model for an all-optical NOT gate. The nonlinear arm of the NMZI is considered to be made of a slotted-PhC waveguide, where the slot is filled with silicon nanocrystal (SiNC/SiO2) material. The high nonlinearity of the SiNC/SiO2 and low group velocity of the PhC make it possible to attain a significant phase shift in low-power high-frequency pulses traveling through the nonlinear arm. A control wave is utilized to increase the phase shift by the cross-phase modulation phenomenon. A complete study on the phase variation is performed by varying various parameters such as powers and pulse widths of the probe and control signal. The study is used to determine the length of the nonlinear arm to calculate the transfer characteristic of the device. The transfer characteristic shows a successful inversion operation in the power range of 28-60 mW for a pulse width of 3 ps. The overall dimension of the device is found as approximate to 112 x 7 mu m(2). Tolerances of the device performance under fabrication imperfections are analyzed by allowing random variations in the positions and the radii of the holes. This study reveals that the inversion characteristic is sustained, even for the significant fabrication imperfections. (C) 2020 Optical Society of America
机译:基于硅光子晶体(PHC)的非线性Mach-Zehnder干涉仪(NMZI)用于为全光学不门设计一个新模型。 NMZI的非线性臂被认为是由开槽-PHC波导制成的,其中槽填充有硅纳米晶(SINC / SIO2)材料。 SINC / SIO2的高非线性和PHC的低群体速度使得可以在通过非线性臂行进的低功率高频脉冲中获得显着的相移。利用控制波来增加交叉相位调制现象的相移。通过改变各种参数,例如探针和控制信号的脉冲宽度等各种参数来执行对相位变型的完整研究。该研究用于确定非线性臂的长度,以计算装置的传递特性。转移特性显示在28-60mW的功率范围内的成功反转操作,脉冲宽度为3 ps。找到设备的整体尺寸为112 x 7 mu m(2)。通过允许孔的位置和半径的随机变化来分析制造缺陷下的装置性能的公差。该研究表明,即使对于显着的制造缺陷,甚至持续反转特性。 (c)2020美国光学学会

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