首页> 外文期刊>Journal of the Optical Society of America, B. Optical Physics >Time-resolved and spectrally resolved ionization with a single ultrashort XUV-IR beamline
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Time-resolved and spectrally resolved ionization with a single ultrashort XUV-IR beamline

机译:用单个超超XUV-IR光束线进行时间分辨和光谱分辨的电离

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摘要

We present a simple upgrade of a time-resolved attosecond extreme ultraviolet and infrared (XUV-IR) setup designed to perform time-resolved or spectrally resolved studies of a target under similar experimental conditions. A flat XUV grating inserted in the path of an attosecond pulse train obtained via high order harmonic generation in gases is used either in the zeroth order of diffraction to follow attosecond dynamics or in the first order of diffraction to study the target spectral response with a temporally stretched single harmonic. Electron momentum measurement is performed with a velocity map imaging spectrometer, and the 10 W femtosecond laser system operating at 5 kHz provides an XUV photon flux compatible with rapid acquisition in both the monochromatic and broadband configurations. The change of experimental configuration between broadband and monochromatic sources is rapid and performed in situ. We present the experimental implementation applied to krypton atoms and detail the capabilities and limits of this approach when an XUV grating with constant groove density is used with a converging XUV beam. (C) 2018 Optical Society of America
机译:我们介绍了一个简单的升级时间分辨的Attosecond紫外线和红外线(XUV-IR)设置,旨在在类似的实验条件下执行对目标的时间分辨或光谱分辨的研究。插入在通过高阶谐波发电的AttoSecond脉冲列表中插入的扁平XUV光栅在衍射的Zeroth顺序中使用,以遵循AttoSecond动态或以第一阶的衍射,以便在时间上使用目标谱响应拉伸单次谐波。通过速度映射成像光谱仪进行电子动量测量,并且在5 kHz运行的10 W Femtosecond激光系统提供了一种与单色和宽带配置中的快速采集兼容的XUV光子通量。宽带和单色来源之间的实验配置的变化是迅速的,以原位进行。我们介绍了应用于Krypton原子的实验性实现,并在恒定槽密度与会聚XUV光束一起使用XUV光栅时,该方法的能力和限制。 (c)2018年光学学会

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    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Bordeaux CNRS CEA Ctr Laser Intenses &

    Applicat CELIA 43 Rue P Noailles F-33400 Talence France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Bordeaux CNRS CEA Ctr Laser Intenses &

    Applicat CELIA 43 Rue P Noailles F-33400 Talence France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

    Univ Claude Bernard Lyon 1 Univ Lyon CNRS ILM F-69622 Villeurbanne France;

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  • 正文语种 eng
  • 中图分类 光学;
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