首页> 外文期刊>Journal of surface investigation: x-ray, synchrotron and neutron techniques >Investigation of the Local Photoconductivity of ZrO 2(Y) Films with Embedded Au Nanoparticles by Conductive Atomic Force Microscopy
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Investigation of the Local Photoconductivity of ZrO 2(Y) Films with Embedded Au Nanoparticles by Conductive Atomic Force Microscopy

机译:用导电原子力显微镜进行嵌入式Au纳米粒子ZrO <下标> 2 (Y)膜的局部光电导性研究

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摘要

The local transverse photoconductivity of ultrathin (~4 nm) ZrO~(2)(Y) films with embedded single-layer arrays of Au nanoparticles (~2 nm in diameter) is studied by conductive atomic force microscopy. The ZrO~(2)(Y) films with Au nanoparticles are formed on glass substrates with transparent conductive indium-tin-oxide sublayers using layer-by-layer magnetron deposition followed by annealing. The peaks observed in the optical absorption spectra of the samples at the wavelength λ ≈ 660 nm are attributed to collective plasmon resonance in dense arrays of Au nanoparticles. The photocurrent between the microscope probe and the indium-tin-oxide sublayer is measured during photoexcitation of the contact between the probe and the sample surface through the transparent substrate by the radiation of a semiconductor laser diode at the plasmon-resonance wavelength. The increase in current through the probe of the atomic force microscope under photoexcitation is attributed to the photon-assisted emission of electrons from the Au nanoparticle into the conduction band of ZrO~(2)(Y) in a strong electric field applied between the probe and the indium-tin-oxide sublayer under plasmon resonance conditions.
机译:通过导电原子力显微镜研究了具有嵌入式单层阵列的超薄(〜4nm)ZrO〜(2)(Y)膜的局部横向光电导性与Au纳米颗粒(直径为2nm)的嵌入式单层阵列。用Au纳米颗粒的ZrO〜(2)(Y)薄膜在具有透明导电铟 - 氧化锡子层的玻璃基板上使用层逐层磁控管沉积,然后退火。在波长λ≈660nm处的样品的光学吸收光谱中观察到的峰值归因于Au纳米颗粒的致密阵列中的集体等离子体共振。显微镜探针与铟 - 锡氧化铟锡子层之间的光电流在探针和样品表面之间通过透明基板在等离子体激光二极管处通过透明基板进行光筛分来测量在等离子体激光二极管的辐射。通过光透镜通过原子力显微镜探针的电流增加归因于从Au纳米粒子的光子辅助发射到探针之间的强电场中的ZrO〜(2)(Y)的导电带在等离子体共振条件下,锡氧化铟锡子层。

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