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The Topmost Water Structure at a Charged Silica/Aqueous Interface Revealed by Heterodyne-Detected Vibrational Sum Frequency Generation Spectroscopy

机译:由外差检测的振动和频率产生光谱显示的带电二氧化硅/水性界面处的最顶层水结构

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Despite recent significant advances in interface-selective nonlinear spectroscopy, the topmost water structure at a charged silica surface is still not clearly understood. This is because, for charged interfaces, not only interfacial molecules at the topmost layer but also a large number of molecules in the electric double layer are probed even with second-order nonlinear spectroscopy. In the present study, we studied water structure at the negatively charged silica/aqueous interface at pH 12 using heterodyne-detected vibrational sum frequency generation spectroscopy, and demonstrated that the spectral component of the topmost water can be extracted by examining the ionic strength dependence of the Imχ~((2)) spectrum. The obtained Imχ~((2)) spectrum indicates that the dominant water species in the topmost layer is hydrogen-bonded to the negatively charged silanolate at the silica surface with one OH group. There also exists minor water species that weakly interacts with the oxygen atom of a siloxane bridge or the remaining silanol at the silica surface, using one OH group. The ionic strength dependence of the Imχ~((2)) spectrum indicates that this water structure of the topmost layer is unchanged in a wide ionic strength range from 0.01 to 2 M.
机译:尽管近期界面选择性非线性光谱的显着进展,但是在充电二氧化硅表面的最顶层水结构仍未清楚地理解。这是因为,对于带电接口,不仅具有最顶层的界面分子,而且还探测了电双层中的大量分子,即使是二阶非线性光谱。在本研究中,我们使用外差检测的振动和频率产生光谱研究了pH12的带负电荷二氧化硅/水界面的水结构,并通过检查离子强度依赖性来提取顶部水的光谱分量IMχ〜((2))光谱。所获得的IMχ〜((2))光谱表明最顶层中的主要水物质与一个OH基团在二氧化硅表面的带负电荷的硅烷酯中氢键。还存在使用一个OH基团与二氧化硅表面的硅氧烷桥的氧原子或剩余的硅烷醇弱相互作用的少量水物质。 IMχ〜((2))光谱的离子强度依赖性表明最顶层的该水结构在宽离子强度范围内不变,从0.01-2米处不变。

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