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首页> 外文期刊>Journal of Infrared, Millimeter and Terahertz Waves >Efficient Terahertz Plasmonic Absorbers with V-Grooves Using Highly Doped Silicon Substrate and Simple Wet-Etching Techniques
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Efficient Terahertz Plasmonic Absorbers with V-Grooves Using Highly Doped Silicon Substrate and Simple Wet-Etching Techniques

机译:高效的太赫兹等级吸收器,具有V形槽的高掺杂硅衬底和简单的湿法蚀刻技术

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摘要

We experimentally demonstrate that at terahertz frequencies perfect plasmonic absorbers made from a 3D V-groove array in a highly doped silicon wafer can be easily realized using simple wet-etching process. The surface plasmon modes can be excited by the V-groove array and get decayed when they propagate along the silicon surface and enter the grooves, inducing a broadband near-zero dip in the reflection spectra. The reflection spectrum of the fabricated absorber is characterized using a terahertz time-domain spectroscopy system, and the experimental results are in good agreement with numerical simulations. The high performance including high absorptivity and large bandwidth together with the easy fabrication processes presented in this paper make this plasmonic absorber promising for a wide range of practical applications in terahertz regime.
机译:我们通过简单的湿法蚀刻工艺易于实现,我们通过实验证明,在太赫兹频率在高掺杂硅晶片中由3D V沟槽阵列制成的完美等离子体吸收剂。 表面等离子体模式可以由V形槽阵列激发,并且当它们沿着硅表面传播并进入凹槽时会衰减,并在反射光谱中诱导宽带接近零级倾斜。 制造吸收器的反射光谱的特征在于使用太赫兹时域光谱系统,实验结果与数值模拟很好。 高性能包括高吸收率和大带宽以及本文介绍的易于制造工艺,使得这种等离子体吸收器对太赫兹制度的广泛实际应用具有广泛的实际应用。

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