Mitigation of operational failures via an economic framework of reliability, availability, and maintainability (RAM) during conceptual design

摘要

Abnormal process situation may lead to tremendous negative impact on sustainability, wellbeing of workers and adjacent communities, company's profit, and stability of supply chains. Failure of equipment and process subsystems are among the primary causes of abnormal situations. The conventional approach in handling failure-based abnormal situations has usually focused on operational strategies. Such an approach overlooks the critical role of process design in mitigating failure, while simultaneously considering the effects of such failure on process economic performance. The aim of this work is to introduce a systematic methodology that accounts for failure early enough during the conceptual design stages. Once a base-case design is developed, the methodology starts by identifying the sources of failure that are caused by reliability issues including equipment, operational procedures, and human errors for a given process system or subsystem. This allows for the identification of critical process subsystem(s) that are more failure-prone or cause greater downtime than other subsystems. Bayesian updating and Monte Carlo techniques are utilized to determine the appropriate distributions for the failure and repair scenario(s), respectively, in question. Markov analysis is used to determine the system availability. Next, the process revenue is described as a function of inherent availability. The effects of failures are incorporated into profitability calculations to establish an economic framework for trading off failure and profitability. In the proposed framework, the economic potential of alternative design scenarios is evaluated and an optimization formulation with the objective of maximizing incremental return on investment (IROI) is utilized to make a design decision. A case study on an ethylene plant is solved to demonstrate the applicability and value of the proposed approach.