Evaluation of the Optical Layout of EXAFS Beam-line at INDUS-2SMS by divergent laser beam

摘要

An Extended X-ray Absorption Fine Structure (EXAFS) beam line for X-ray absorption studies using energy dispersive geometry and position sensitive detector is being developed for the INDUS-2 Synchrotron source. The beamline would use an elliptically bent Si crystal for dispersion and horizontal focusing of the synchrotron beam. A vertically focusing mirror would be used prior to the bent crystal for vertical focusing of the synchrotron beam as well as for higher harmonic rejection from the spectra. The optical layout of the beamline has been evaluated by numerical simulation using the ray tracing programme "SHADOW" and the layout has also been tested experimentally using a divergent laser beam.