机译:高能质子辐射后Si辐射诱导的缺陷
Institute for Theoretical and Experimental Physics B. Cheremushkinskaya 25 117218 Moscow Russia;
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute) 115409 Moscow Russia;
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute) 115409 Moscow Russia;
Institute for Theoretical and Experimental Physics B. Cheremushkinskaya 25 117218 Moscow Russia;
positron; annihilation; proton irradiation; radiation defects; annealing; Si wafer; positron source.;
机译:高能质子辐射后Si辐射诱导的缺陷
机译: p 重点>? <重点类型=“斜体”> P Emphasis>
机译:质子辐照对聚二甲基硅氧烷嵌入的胶体摄入/ ZnS核 - 壳量子点的影响:通过时间分辨的光致发光分析来区分核心诱导的缺陷
机译:高能质子辐射后Si辐射诱导的缺陷
机译:隔离辐射诱发的偏析在质子辐照奥氏体不锈钢的辐照辅助应力腐蚀开裂中的作用。
机译:使用小鼠模型比较质子和光子束辐照引起的肠道损伤
机译:用高能质子辐射测量低温温度钨丝的缺陷诱导电阻率变化