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Influence of a silicon impurity on growth of diamond crystals in the Mg-C system

机译:硅杂质对Mg-C系统中金刚石晶体生长的影响

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摘要

This article reports a study of the morphology of diamond crystals grown at 7.0?GPa and 1800?°C in the Mg-C system with the addition of silicon in an amount of 0.5?wt%. Step patterns on {111} and {100} faces were studied in a wide range of magnifications using optical microscopy (DIC), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Morphological studies revealed that a reduction in the growth rate and a change in the morphological significance of the {100} and {111} faces were associated with adsorption of a mobile impurity (silicon) leading to poisoning of kinks and (or) steps. This leads to roughing of the faces and formation of macrosteps as well as 2D and 3D nucleation islands. At a silicon concentration of 1.0?wt% or more, immobile impurity particles are apparently formed on macrostep terraces, and growth inhibition occurs according to the Cabrera-Vermilyea model.
机译:本文报道了在MG-C系统中在7.0℃和1800℃下生长的金刚石晶体形态的研究,其中添加硅的量为0.5℃。 在使用光学显微镜(DIC),扫描电子显微镜(SEM)和原子力显微镜(AFM)的各种放大倍数范围内研究{111}和{100}面上的步进图案。 形态学研究表明,{100}和{111}面部的生长速率和变化的变化与导致扭结和(或)步骤中毒的流动杂质(硅)的吸附有关。 这导致粗糙的脸部和形成宏辐射以及2D和3D成核岛。 在1.0·wt%以上的硅浓度下,显然在宏辐射露台上形成固定杂质颗粒,并且根据Cabrera-vermilyea模型发生生长抑制。

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