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Assessment of quality and reliability of band structures from exact-exchange-only Kohn-Sham, hybrid, and GW methods

机译:评估频带结构的质量和可靠性,从精确交换kohn-sham,杂种和gw方法进行评估

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摘要

Band gaps for a large number of semiconductors obtained with the exact-exchange(EXX)-only Kohn-Sham method are compared to those from various generalized Kohn-Sham methods based on hybrid functionals and with experimental values. EXX band gaps are shown to be of superior quality than the band gaps from most of the considered hybrid methods, band gaps obtained with the hybrid functional HSE06 have a similar quality as EXX ones. The EXX method is found to yield d-electron binding energies that are clearly superior to those determined within the local density approximation and to be comparable to d-electron binding energies from GW approaches. EXX plane-wave pseudopotential calculations and EXX all-electron calculations are shown to yield very similar KS transition energies demonstrating that the plane-wave pseudopotential approach is well-suited for EXX methods. Previous discrepancies between pseudopotential and all-electron calculations, most likely, have to be attributed to technical problems in early all-electron EXX calculations.
机译:将具有精确交换(EXX)-Only Kohn-Sham方法获得的大量半导体的带间隙与基于混合功能的各种广义的Kohn-Sham方法和实验值进行比较。 EXX带隙显示出优异的质量比来自大多数所考虑的混合方法的带隙,用混合功能的HSE06获得的带间隙具有与EXX系列相似的质量。发现EXX方法产生D-Electron结合能量,该能量显然优于局部密度近似确定的那些,并且与来自GW方法的D-Collecton Energies相当。 EXX平面波伪能量计算和EXX全电子计算结果显示出非常相似的KS过渡能量,证明平面波伪能量方法非常适合EXX方法。 PseudoPotential和全电子计算之间的先前差异必须归因于早期全电子EXX计算中的技术问题。

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