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Infinite-dimensional Log-Determinant divergences between positive definite Hilbert-Schmidt operators

机译:积极明确的Hilbert-Schmidt运算符之间的无限尺寸日志决定性分歧

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The current work generalizes the author's previous work on the infinite-dimensional Alpha Log-Determinant (Log-Det) divergences and Alpha-Beta Log-Det divergences, defined on the set of positive definite unitized trace class operators on a Hilbert space, to the entire Hilbert manifold of positive definite unitized Hilbert-Schmidt operators. This generalization is carried out via the introduction of the extended Hilbert-Carleman determinant for unitized Hilbert-Schmidt operators, in addition to the previously introduced extended Fredholm determinant for unitized trace class operators. The resulting parametrized family of Alpha-Beta Log-Det divergences is general and contains many divergences between positive definite unitized Hilbert-Schmidt operators as special cases, including the infinite-dimensional affine-invariant Riemannian distance and the infinite-dimensional generalization of the symmetric Stein divergence.
机译:目前的工作概括了作者以前的无限维尔法日志决定因素(Log-Det)分歧和alpha-beta log-det分解的工作,在Hilbert Space上的一组正定的迹线课程运算符上定义了 整个Hilbert歧管积极确定的Hilbert-Schmidt运营商。 除了先前引入的较延长的弗雷德霍姆决定簇,通过引入延长的希尔伯特 - 施密特运营商进行了扩展的Hilbert-Schmidt运算符来进行这一概括。 由此产生的参数化的alpha-beta log-det分歧是一般的,并且在正定的单位单调的Hilbert-Schmidt运营商之间包含许多分歧,包括无限尺寸仿射率的黎曼距离和对称斯坦的无限尺寸概括 分歧。

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