首页> 外文期刊>Plasma physics and controlled fusion >Estimation of carbon impurity from the guard limiter of the lower hybrid wave antenna on EAST tokamak
【24h】

Estimation of carbon impurity from the guard limiter of the lower hybrid wave antenna on EAST tokamak

机译:估计东托卡马克下杂交波天线的防护装置碳杂质

获取原文
获取原文并翻译 | 示例
           

摘要

Hot spots on the EAST tokamak graphite guard limiters of the lower hybrid wave (LHW) antenna may cause a sudden increase of impurity influx and even ending with disruption. A sheath model is developed by taking into account the energetic electron component from the plasma-LHW interaction via electron Landau damping, and then a self-consistent method is used to study the interaction of the plasma across the sheath at the material surface and material thermal response. It is found that the fast electron fluxes driven by both the 2.45 and 4.6 GHz LHWs modify strongly the sheath potential, which then influence on the bombarding ion energy at the material surface and the surface temperature. By calculating the carbon physical sputtering and chemical erosion from guard limiter of the LHW antenna, the carbon production from the guard limiter in two LHW systems is found to have different behavior for the same edge plasma density and electron temperature. Our results show that carbon impurity is mainly from physical sputtering, except for the 4.6 GHz LHW in a narrow range of the high electron temperature where the chemical erosion has a very sharp increase. Due to modification of the sheath potential induced by the fast electrons, the power density is higher with the 4.6 GHz than the 2.45 GHz LHW system. As a consequence the surface temperature is higher at 4.6 GHz and susceptible to reach several hundred of degrees which is prone to chemical erosion.
机译:较低混合波(LHW)天线的东部托卡马克石墨卫局的热点可能导致杂质流入突然增加,甚至以破坏结束。通过通过电子Landau阻尼从等离子体-LHW相互作用来考虑高能电子成分来开发护套模型,然后使用自我一致的方法来研究材料表面和材料热量的鞘中等离子体的相互作用回复。结果发现,由2.45和4.6GHz LHW驱动的快速电子磁通量强烈地修改鞘电位,然后对材料表面和表面温度的轰击离子能量影响。通过计算LHW天线的防护装置的碳物理溅射和化学腐蚀,发现来自两个LHW系统中的防护装置的碳产生具有不同的边缘等离子体密度和电子温度的不同行为。我们的结果表明,碳杂质主要来自物理溅射,除了4.6GHz LHW在狭窄的高电子温度范围内,化学腐蚀的增加非常急剧增加。由于快速电子引起的鞘电位的修改,功率密度高于4.6GHz比2.45GHz LHW系统更高。结果,表面温度高4.6GHz并且易于达到几百度,这易于化学侵蚀。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号