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Effect of temperature on corrosion and semiconducting properties of oxide films formed on M5 zirconium alloy

机译:温度对M5锆合金上形成的氧化膜的腐蚀和半导体性能的影响

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摘要

Nuclear fuel cladding for pressurised water reactors is commonly manufactured with zirconium alloys. The M5 alloy is a relatively new cladding material for in-reactor used with enhanced performance compared to traditional zircaloys. In this work, the influence of temperature on the corrosion resistance and semiconducting properties of the passive film formed on the M5 alloy in a borate buffer solution has been evaluated. The electrochemical behaviour of the zirconium alloy was assessed by potentiodynamic polarisation tests, electrochemical impedance spectroscopy and Mott-Schottky plots. The results indicated that the corrosion resistance of the M5 alloy decreased with temperature due to the formation of a less stable and more defective passive film. The Mott-Schottky approach used in combination with polarisation tests and impedance measurements was effective to reveal the protective state of the passive film on the M5 alloy.
机译:用于压水堆的核燃料包壳通常由锆合金制成。与传统的锆合金相比,M5合金是用于反应器的相对较新的熔覆材料,具有增强的性能。在这项工作中,已经评估了温度对硼酸盐缓冲溶液中M5合金上形成的钝化膜的耐蚀性和半导体性能的影响。通过电位动力学极化试验,电化学阻抗谱和莫特-肖特基图评估了锆合金的电化学行为。结果表明,M5合金的耐蚀性随温度的降低而降低,这是由于形成了较不稳定且缺陷较多的钝化膜。结合极化测试和阻抗测量使用的Mott-Schottky方法有效地揭示了M5合金上钝化膜的保护状态。

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