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首页> 外文期刊>Surface review and letters >MONITORED DEFORMATION BY POTENTIAL-INDUCED DEFECTS IN CH3(CH2)n?1SH SELF-ASSEMBLED MONOLAYERS ON GOLD: EIS STUDY OF CHAIN LENGTH EFFECT ON SUBDIFFUSION AND SAMs’ HETEROGENEITY
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MONITORED DEFORMATION BY POTENTIAL-INDUCED DEFECTS IN CH3(CH2)n?1SH SELF-ASSEMBLED MONOLAYERS ON GOLD: EIS STUDY OF CHAIN LENGTH EFFECT ON SUBDIFFUSION AND SAMs’ HETEROGENEITY

机译:通过CH3(CH2)N的潜在诱导的缺陷监测变形(CH2)N?1SH自组装单层上的金色:EIS研究链长对底裂和SAMS异质性的影响

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摘要

From the defects-free self-assembled organic layers (SAMs) of CH3(CH2)n?1SH molecules with short chain lengths (n=4,6,8) electrodeposited on the (111) surface of monocrystalline gold previously prepared, monitored defects (pinholes) were potential-induced from cyclic partial reduction of SAMs at an appropriate potential. Electrochemical impedance measurements were in-situ conducted and [Fe(CN)6]3?∕4? ions were used as probes for mass and charge transfer. Interface evolution was modeled with an equivalent electrical circuit containing two distinct constant-phase elements (CPEs). One is a generalized semi-infinite Warburg element in series with a charge transfer resistance attributed to subdiffusion phenomenon through leaky sublayers at low frequencies; the other CPE is used for characterizing the interface heterogeneity at medium and high frequencies. At low frequencies, electrochemical impedance measurements show subdiffusion phenomenon, which depends on the remaining sublayer and its thickness. When the defect density increases, diffusion tends to be ordinary, obeying the Fick’s law.
机译:来自CH3(CH2)N 2的无缺陷自组装有机层(SAMS),其具有短链长度(n = 4,6,8)的分子电沉积在先前制备的单晶金的(111)表面上,监测缺陷(针孔)在适当的电位下从SAM的循环部分减少潜在诱导。电化学阻抗测量是原位进行的,[Fe(CN)6] 3?/ 4?离子用作质量和电荷转移的探针。界面演进用包含两个不同的恒定相位元素(CPE)的等效电路建模。一个是串联的广义半无限Warburg元素,其电荷转移阻力由于低频下通过泄漏子层而归因于子边域现象;其他CPE用于表征介质和高频的界面异质性。在低频下,电化学阻抗测量显示了沉降现象,这取决于剩余的子层及其厚度。当缺陷密度增加时,扩散往往是普通的,遵守Fick的定律。

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