...
机译:碱表面处理对CZ-硅晶片界面界面密度和少数型载体寿命的影响
*Research Center in Semiconductor Technology for Energetic (CRTSE) 02 Bd. Frantz Fanon–Alger BP N°140 Les 07 Merveilles–Algiers Algeria;
*Research Center in Semiconductor Technology for Energetic (CRTSE) 02 Bd. Frantz Fanon–Alger BP N°140 Les 07 Merveilles–Algiers Algeria;
?Department of Electronics Faculty of Technology Ferhat Abbas University Setif Algeria;
*Research Center in Semiconductor Technology for Energetic (CRTSE) 02 Bd. Frantz Fanon–Alger BP N°140 Les 07 Merveilles–Algiers Algeria;
*Research Center in Semiconductor Technology for Energetic (CRTSE) 02 Bd. Frantz Fanon–Alger BP N°140 Les 07 Merveilles–Algiers Algeria;
*Research Center in Semiconductor Technology for Energetic (CRTSE) 02 Bd. Frantz Fanon–Alger BP N°140 Les 07 Merveilles–Algiers Algeria;
?Department of Electronics Faculty of Technology Ferhat Abbas University Setif Algeria;
Interface states; alkaline solutions; minority carrier lifetime;
机译:碱表面处理对CZ-硅晶片界面界面密度和少数型载体寿命的影响
机译:异质结太阳能电池硅晶片表面制备用X射线光电子能谱分析,有效的少数载流子
机译:制备工艺和退火处理对硅纳米线薄膜少数载流子寿命的影响
机译:低电阻率CZ-硅晶片和太阳能电池中少数载体寿命的光引起的光诱导降解 - 国际联合研究
机译:硅上异质外延的锗中少数载流子寿命与缺陷密度分布的经验相关性。
机译:制备工艺和退火处理对硅纳米线薄膜少数载流子寿命的影响
机译:制备工艺和退火处理对硅纳米线薄膜少数载流子寿命的影响
机译:用于可重复的少数载体寿命测量的晶圆制备和碘 - 乙醇 - 乙醇钝化程序:预印