Prediction of germination of commercially available seed lots by regression models developed by artificial and natural ageing and electrical conductivity in leek

摘要

This work aimed to determine whether measurements of electrical conductivity of solute leakage of leek seeds could be used to predict germination in commercially available seed lots. Prediction of germination was conducted through logit regression equations developed between EC and germination for either artificially or naturally aged seed samples. For artificial ageing, 16 serial samples that differed in germination were produced by storing seeds at 45 degrees C with 20% seed moisture content for 72 hours. Twenty-two naturally aged seed lots obtained from different sources were tested. Logit regression models (generalised linear models) were developed between EC and total (R-2= 0.958, R-2 = 0.958, P < 0.001) and normal (R-2= 0.946, R-2= 0.823, P < 0.001) germination percentages for artificially and naturally aged seeds, respectively. The actual total and normal germination percentages of 13 seed lots were predicted by logit regression equations of artificial and natural ageing. The predicted germinations from the developed logit regression equations with EC were highly related (linear regression analysis) to actual total (R-2 = 0.716, P < 0.001 artificial; R-2 = 0.648, P < 0.001 natural) and normal germination (R-2= 0.843, P < 0.001 artificial; R-2= 0.821, P < 0.001 natural). The relationship between EC and normal and total germination of thiram treated and untreated seed lots were tested and R-2 values ranged between 0.576 and 0.959 (P < 0.05).