Two-exposure quasi-common-path point diffraction interferometric phase microscopy using a four-step algorithm

摘要

A two-exposure nearly common-path point diffraction interferometric phase microscopy (IPM) is presented using polarization modulation and one-step grating shifting to implement quantitative phase imaging. The IPM is constructed by an improved Michelson configuration with a reflective grating, and its frequency spectrum generated by a circularly polarized object beam makes double copies through a beam splitter. One copy is low-pass filtered and reflected by a reflective pinhole mirror to create a reference beam, and the other copy is converted by a polarizer and then reflected by a reflective grating to achieve a 45 degrees linearly polarized object beam. By the combination of a polarizing cube beam splitter with 45 degrees tilted angle and a translation of the reflective grating with a pi phase shift, four interferograms with pi/2 phase shift can be obtained in two exposures. The standard four-step algorithm can then be used to reconstruct the phase of the specimen. The utility of the proposed method was demonstrated with measurements on a phase plate, cells and an oil drop.