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首页> 外文期刊>Revista de Chimie >Influenta procesului de delimitare asupra caracteristicilor fotodetectorilor pe baza de PbS
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Influenta procesului de delimitare asupra caracteristicilor fotodetectorilor pe baza de PbS

机译:限制过程对基于PBS的光电探测器特征的影响

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摘要

Photoconductive PbS thin films deposited on glass substrate by Chemical Bath Deposition(CBD)must be delimited for obtaining the suitable configuration.It was applied a photolithographic method using a positive photoresist AZ1350.The influence of reagents and the other treatments used during this process,on the electrical(sheet electrical resistance)and photoelectrical parameters(specific detectivity),ofphotodetectors respectively,was studied.The variation of the parameters was determined after each stage and overall.It was observed that the reagents and the treatments applied in the delimitation process,without reducing the photosensitive area,determined an average increasing of sheet electrical resistance with 40 % and noteworthy improving of detectivity.After diminution of photoconductive area 32,14 times,and adequate thermal treatment,the specific detectivity increased from 10~9 to 10~(11)cm centre dot Hz~(1/2)w~(-1),at 300 K temperature.The studied photolithographic method could be applied successfully in photodetectors manufacturing.
机译:必须将光电导PBS薄膜通过化学浴沉积(CBD)沉积在玻璃基板上,以获得合适的构型。使用正光致抗蚀剂AZ1350施加光刻法。试剂的影响和在此过程中使用的其他处理研究了光电图的电气(片材电阻)和光电参数(特定检测率)。在每个阶段和总体上测定参数的变化。观察到试剂和在划分过程中应用的治疗方法,没有减少光敏区域,确定了片材电阻的平均增加,具有40%和值得注意的探测器。在光电导面积的减少32,14次的减少,并且足够的热处理时,特定检测率从10〜9增加到10〜(11 )CM中心点Hz〜(1/2)W〜(-1),300 k温度。研究的光刻方法可以是在光电探测器制造中成功应用。

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