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Strong-field optoelectronics in solids

机译:固体强光光电子

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Perturbative optical nonlinearities induced by static electric fields(1) have proven useful in visualizing dynamical function in systems including operating circuits(2,3), electric and magnetic domain walls(4), and biological matter(5), and in controlling light for applications in silicon photonics(6). Here, we extend field-induced second-harmonic generation to the non-perturbative regime. We demonstrate that static or transient fields up to terahertz (THz) frequencies applied to silicon and ZnO crystals generate even-order high harmonics. Images of the even harmonics confirm that static fields delivered with conventional electronics control the spatial properties of the high-harmonic emission. Extending our methodology to higher-harmonic photon energies(7,8) paves the way for realizing active optics in the extreme ultraviolet and will allow imaging of operating electronic circuits(9), of Si-photonic devices(10) and of other functional materials(11,12), with higher spatio-temporal resolution than perturbative methods. For THz spectroscopy, our method has the bandwidth to allow measurement of attosecond transients imprinted on THz waveforms.
机译:由静电场(1)引起的扰动光学非线性已经证明是可用于可视化系统中的动态功能,包括操作电路(2,3),电磁畴壁(4),以及生物物质(5),以及控制光硅光子学中的应用(6)。在这里,我们将现场引起的二次谐波生成扩展到非扰动制度。我们证明,施加到硅和ZnO晶体的太赫兹(THz)频率的静态或瞬态场产生均匀的高谐波。即使谐波的图像确认使用传统电子设备提供的静态字段控制高谐波发射的空间特性。向更高谐波的光子能量(7,8)扩展我们的方法(7,8)铺平了在极端紫外线中实现有源光学器件的方式,并且将允许Si-光子器件(10)和其他功能材料的操作电子电路(9)的成像(11,12),具有比扰动方法更高的时空分辨率。对于THz光谱,我们的方法具有带宽,以允许测量印迹的Attsecond瞬态压印。

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