首页> 外文期刊>Minerals Engineering >Automated ore microscopy based on multispectral measurements of specular reflectance. I - A comparative study of some supervised classification techniques
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Automated ore microscopy based on multispectral measurements of specular reflectance. I - A comparative study of some supervised classification techniques

机译:基于镜面反射率多光谱测量的自动矿石显微镜。 I - 对一些监督分类技术的比较研究

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摘要

Automated mineralogy, including quantitative compositional and textural information, is a requirement for an efficient ore processing, and is comprised as an important input for geometallurgical planning. Classical ore microscopy is seen by many potential users as an outdated, time consuming, tool. Thus, SEM-based systems are often the choice for those who can afford them, in spite of their evident limitations for some minerals (e.g. for iron oxide ores). However, automated and quantitative mineral characterisation of metallic ores is also possible with optical (reflected light) microscopes, attaining similar performance at a much lower price than SEM systems, as shown by the AMCO (Automated Microscopic Characterisation of Ores) prototype. This system relies on the measurement of multispectral specular reflectance, R, on polished ore sections, to achieve automated identification of the ore species (reflectance is computed from grey levels of digital images acquired by automated scanning of the sample). The performance of this approach, supported by a multispectral reflectance database covering the VNIR range (370-1000 nm) built with the AMCO System, is analysed in this paper, comparing the reliability of different classification methods to achieve ore identification.
机译:自动矿物学,包括定量组成和纹理信息,是有效矿石加工的要求,并包括作为几何冶金计划的重要输入。许多潜在用户视为过时,耗时,工具的典型矿石显微镜。因此,尽管对某些矿物质(例如用于氧化铁矿石),SEM系列的系统通常是能够负担得起的人的选择。然而,光学(反射光)显微镜也可以实现金属矿石的自动化和定量矿物表征,比SEM系统高出比SEM系统的更低的相似性能,如AMCO(矿石的自动微观表征)原型所示。该系统依赖于多光谱镜面反射率的测量,在抛光矿体部分上,以实现矿石物种的自动识别(从通过自动扫描的自动扫描获取的数字图像的灰度级别的反射率)。本文分析了采用AMCO系统内置的VNIR范围(370-1000nm)的多光谱反射率数据库支持的这种方法的性能,比较了不同分类方法的可靠性来实现矿石识别。

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