首页> 外文期刊>Materials science in semiconductor processing >Characterization of high photosensitivity nanostructured 4H-SiC/p-Si heterostructure prepared by laser ablation of silicon in ethanol
【24h】

Characterization of high photosensitivity nanostructured 4H-SiC/p-Si heterostructure prepared by laser ablation of silicon in ethanol

机译:乙醇中硅激光烧蚀制备的高光敏纳米结构4H-SiC / P-Si异质结构的表征

获取原文
获取原文并翻译 | 示例
           

摘要

This paper presents the first study on characterization of high sensitivity 4H-SiC/Si heterojunction photodetector prepared by deposition of SiC nanoparticles NPs on silicon substrate by drop casting. Synthesis of the SiC NPs was performed by laser ablation of silicon target immersed in ethanol with 1.064 mu m Nd:YAG laser pulses at various laser fluences (318-9.55) J/cm(2). The morphological, structural, electrical, and optical properties of SiC NPs were investigated as function of laser fluence. The absorption data showed that the value of optical energy gap of SiC nanoparticles depend on the laser fluence. TEM investigation showed that SiC NPs having spherical shape with sizes in the range (5-65) nm. The optical energy gap of SiC NPs prepared at different laser fluences has been determined from optical properties and found to be in the range (3.45-3.75 eV). The electrical properties of SiC/Si heterojunction shows a good rectification ratio and the value of ideality factor varied from 1.72 to 3.51 depending on the laser fluence. Capacitance -voltage properties of heterojunctions showed a linear relationship between C-2 and reverse bias voltage and the value of built-in potential was found in the range (0.45-0.8) V. The effect of laser fluence on the photodetector figures of merit namely; photosensitivity, detectivity and rise time was discussed and analyzed.
机译:本文介绍了通过掉落铸造在硅衬底上沉积SiC纳米颗粒NPS制备的高灵敏度4H-SiC / Si异质结光电探测的第一研究。通过在乙醇中浸入乙醇中的激光烧蚀来进行SiC NPS的合成,其各种激光流量(318-9.55)J / cm(2)。 SiC NP的形态学,结构,电气和光学性质被研究为激光物流量的功能。吸收数据显示,SiC纳米颗粒的光学能隙的值取决于激光物流量。 TEM研究表明,SiC NPS具有球形形状,其尺寸在范围(5-65)nm。在不同激光流量下制备的SiC NP的光学能隙已经从光学性质确定,发现在范围内(3.45-3.75eV)。 SiC / Si异质结的电性能显示出良好的整流率,理想因子的值根据激光器流量为1.72至3.51而变化。异质结的电容 - 杂交属性显示C-2和反向偏置电压之间的线性关系,并且在范围内(0.45-0.8)V.激光效果对光电探测器的影响;讨论和分析了光敏性,探测和上升时间。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号