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Decay curve analysis for data error quantification in time-domain induced polarization imaging

机译:时域诱导极化成像中数据误差量化的衰变曲线分析

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In recent years, the time-domain induced polarization (TDIP) imaging technique has emerged as a suitable method for the characterization and the monitoring of hydrogeologic and biogeochemical processes. However, one of the major challenges refers to the resolution of the electrical images. Hence, various studies have stressed the importance of data processing, error characterization, and the deployment of adequate inversion schemes. Awidely accepted method to assess data error in electrical imaging relies on the analysis of the discrepancy between normal and reciprocal measurements. Nevertheless, the collection of reciprocals doubles the acquisition time and is only viable for a limited subset of commonly used electrode configurations (e.g., dipole-dipole [DD]). To overcome these limitations, we have developed a new methodology to quantify the data error in TDIP imaging, which is entirely based on the analysis of the recorded IP decay curve and does not require recollection of data (e.g., reciprocals). The first two steps of the methodology assess the general characteristics of the decay curves and the spatial consistency of the measurements for the detection and removal of outliers. In the third and fourth steps, we quantify the deviation of the measured decay curves from a smooth model for the estimation of random error of the total chargeability and transfer resistance measurement. The error models and imaging results obtained from this methodology - in the following referred to as "decay curve analysis" - are compared with those obtained following a conventional normalreciprocal analysis revealing consistent results. We determine the applicability of our methodology with real field data collected at the floodplain scale (approximately 12 ha) using multiple gradient and DD configurations.
机译:近年来,时域诱导的极化(TDIP)成像技术已成为表征和监测水文地质和生物地球化学过程的合适方法。然而,其中一个主要挑战是指电力图像的分辨率。因此,各种研究强调了数据处理,错误表征和适当反转方案的部署的重要性。缺陷的方法来评估电成像中的数据误差依赖于对正常和互易测量之间的差异的分析。然而,倒数的集合可以加倍获取时间,并且仅适用于常用电极配置的有限子集(例如,偶极偶极液[DD])。为了克服这些限制,我们已经开发了一种新方法来量化TDIP成像中的数据误差,这完全基于记录的IP衰减曲线的分析,并且不需要回忆数据(例如,互惠)。方法的前两个步骤评估了衰减曲线的一般特征和测量的空间一致性,用于检测和移除异常值。在第三和第四步骤中,我们通过平滑模型量化测量的衰减曲线的偏差,以估计总带电和传递电阻测量的随机误差。将从该方法获得的误差模型和成像结果 - 将其称为“衰变曲线分析” - 与常规普通普通分析所获得的那些进行比较,揭示一致的结果。我们使用多个梯度和DD配置,确定我们的方法的适用性与在洪泛区(大约12公顷)上收集的真实现场数据。

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