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Hopping Mechanism of Charge Transfer in the Thin Layers of a Ge28.5Pb15S56.5 Vitreous System

机译:电气薄层电荷转移机理玻璃体系统的薄层

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摘要

The results of the study of the charge transfer processes in the thin layers of a Ge28.5Pb15S56.5 vitreous system are presented. The power-law dependence of the conductivity on frequency and a decrease in the value of the exponent s with increasing temperature are found. The charge transfer is a thermally activated process and two areas on the temperature dependence of conductivity are present. The activation energies of these areas are E-1 = 0.20 +/- 0.01 and E-2 = 0.50 +/- 0.01 eV, respectively. The obtained results are explained within the scope of the correlated barrier hopping (CBH) model of the hopping conductivity in disordered systems. The main microparameters of the system, namely, the density of the localized state (N), hopping length (R-omega), and the maximal value of the height of the potential barrier (W-M), are calculated.
机译:提出了GE28.5PB15S56.5玻璃系统薄层中电荷转移过程的研究结果。 发现电导率对频率的电力 - 依赖性和降低指数S的降低随温度的增加。 电荷转移是热活化的过程,存在导电性温度依赖性的两个区域。 这些区域的激活能量分别是E-1 = 0.20 +/- 0.01和E-2 = 0.50 +/- 0.01eV。 所得结果在无序系统中跳跃电导率的相关屏障跳跃(CBH)模型的范围内解释。 计算系统的主要微观仪,即局部状态(n),跳跃长度(R-ω)的密度和潜在屏障(W-M)的高度的最大值。

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