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Recent Progress in III-Nitride Tunnel Junction-Based Optoelectronics

机译:基于III - 氮化物隧道结基光电子的进展

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摘要

Tunnel junctions have garnered much interest from the III-Nitride optoelectronic research community within recent years. Tunnel junctions have seen applications in several material systems with relatively narrow bandgaps as compared to the III-Nitrides. Although they were initially dismissed as ineffective for commercial device applications due to high voltage penalty and on resistance owed to the wide bandgap nature of the III-Nitride material systems, recent development in the field has warranted further study of such tunnel junction enabled devices. They are of particular interest for applications in III-Nitride optoelectronic devices in which they can be used to enable novel device designs which could potentially address some of the most challenging physical obstacles presented with this unique material system. In this work we review the recent progress made on the study of III-Nitride tunnel junction-based optoelectronic devices and the challenges which are still faced in the field of study today.
机译:隧道交叉点近年来曾在III族氮化物光电研究界获得了很多兴趣。与III-氮化物相比,隧道结在具有相对窄的带隙的几种材料系统中的应用。虽然由于高电压损失和III族氮化物材料系统的宽带隙性质,它们最初被驳回为商业设备应用无效,但是该领域最近的开发近期开发了对这种隧道结的进一步研究。它们特别令人兴趣的是III - 氮化物光电装置的应用,其中它们可用于实现新颖的设备设计,这可能会解决具有这种独特的材料系统提供的一些最具挑战性的物理障碍。在这项工作中,我们审查了对基于III族隧道结的光电器件以及仍面临着今天研究领域的挑战的最新进展。

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