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Stereological bias for spherical particles with various particle compositions

机译:具有各种粒子组成的球形粒子的立体偏差

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Two-dimensional (2D) measurements of the cross-sections of polished mineral samples suffer from an overestimation of the degree of liberation known as stereological bias. Stereological bias is believed to be affected by the particle texture, i.e., the stereological bias of a simple locking particle is high, while the bias of a particle with a complex texture is negligible. However, scant work has been performed on the development of a quantitative and versatile modeling of stereological bias. We performed a series of numerical simulations: modeling particle assembly using the discrete element method; modeling the binary texture of particles by imposing phase patterns to the particles; systematical generation of 8608 types of phase patterns; liberation assessments in 2D and in three-dimension (3D) based on the error-free geometrical calculation; and stereological bias assessment by a comparison between liberations in 2D and 3D. Through these simulations, the correlation between the stereological biases of the phases and particle texture was investigated. Finally, the particle texture complexity was assessed using the fractal dimension of image intensity, and stereological bias for the matrix phase was successfully correlated with the fractal dimension and area fraction of the core phase. Fractal dimension and area fraction values are easily obtained by 2D measurements and subsequent image analysis. These results may lead to the establishment of a versatile stereological correction model that depends only on measurable 2D parameters. (C) 2016 The Society of Powder Technology Japan. Published by Elsevier B.V. and The Society of Powder Technology Japan. All rights reserved.
机译:抛光矿物样品横截面的二维(2D)测量结果会高估了解放度,即所谓的立体偏差。据信立体偏差受颗粒纹理的影响,即简单的锁定颗粒的立体偏差高,而具有复杂纹理的颗粒的偏差可忽略不计。但是,在立体偏倚的定量和通用建模开发方面所做的工作很少。我们执行了一系列数值模拟:使用离散元素方法对粒子组装进行建模;以及通过对粒子施加相位图来对粒子的二元纹理进行建模;系统生成8608种相位模式;基于无误差几何计算的2D和3D(3D)解放评估;并通过比较2D和3D的解放来进行立体偏见评估。通过这些模拟,研究了相的立体偏差与颗粒纹理之间的相关性。最后,使用图像强度的分形维数评估了粒子的纹理复杂性,并且成功地将基质相的立体偏差与核心相的分形维数和面积分数相关联。分形维数和面积分数值可通过2D测量和随后的图像分析轻松获得。这些结果可能导致建立仅依赖于可测量2D参数的通用立体校正模型。 (C)2016日本粉末技术学会。由Elsevier B.V.和日本粉末技术学会出版。版权所有。

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