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Library based identification and characterisation of polymers with nano-FTIR and IR-sSNOM imaging

机译:基于文库的纳米FTIR和IR-SSNOM成像的聚合物鉴定与表征

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摘要

AFM is a technique widely applied in the nanoscale characterisation of polymers and their surface properties. With nano-FTIR and IR-sSNOM imaging an optical dimension is added to this technique that allows for straightforward high resolution characterisation and spectroscopy of polymers. As the volume sampled by these near-field techniques depends mostly on the radius of the cantilever tip, typically 10 nm, it is orders of magnitude smaller than in conventional techniques. Nevertheless, comparability of nano-FTIR near-field spectra and data from macroscopic methods has been shown. Some relevant polymers such as polystyrene however, prove to be more difficult to detect than others. Furthermore, the small sampled volume suggests lower signal quality of nano-FTIR data and proof of its suitability for a reliable library search identification is lacking. To evaluate the techniques especially towards automatic and higher throughput identification of nanoscale polymers, for example in blends or environmental samples, we examined domain distributions in a PS-LDPE film and spectral responses of foils of the most relevant commercial polymers. We demonstrate the successful library search identification of all samples with nano-FTIR data measured in less than seven minutes per spectrum with a free IR spectra database in combination with established commercial OPUS 7.5 software and the recently released freeware siMPle. We discuss aspects affecting the accuracy of the identification for different polymers and show that the small spectral range of 1700-1300 cm(-1) already leads to similar success in differentiating between polymer types with near-field data as with conventional far-field FTIR spectroscopy. Even a polymer sample weathered in the environment can be identified without prior cleaning, proving wide fields of applications for characterisation and identification of diverse polymer samples. Finally, we propose measurement and analysis strategies for known and unknown samples with this novel technique.
机译:AFM是一种在聚合物和其表面性质的纳米级表征中广泛应用的技术。通过纳米FTIR和IR-SSNOM成像,将光学尺寸添加到该技术中,允许直接的高分辨率表征和聚合物的光谱学。随着这些近场技术采样的体积主要取决于悬臂尖端的半径,通常为10nm,它是小于常规技术的数量级。然而,已经示出了纳米FTIR近场光谱和来自宏观方法的数据的可比性。然而,一些相关聚合物如聚苯乙烯,证明比其他聚苯乙烯更难以检测。此外,小型采样体积表明纳米FTIR数据的较低信号质量,并且缺乏可靠库搜索识别的适用性的证明。为了评估纳米级聚合物的自动和更高产量鉴定的技术,例如在共混物或环境样品中,我们检查了PS-LDPE薄膜中的域分布,以及最相关商业聚合物的箔的光谱响应。我们展示了在每种频谱的纳米FTIR数据中测量的所有样本的成功图书馆搜索识别,与自由IR光谱数据库相结合,与已建立的商业Opus 7.5软件和最近发布的免费软件简单。我们讨论影响不同聚合物鉴定的准确性的方面,并表明,1700-1300cm(-1)的小光谱范围已经导致与传统的远场FTIR具有近场数据的聚合物类型之间的类似成功光谱学。即使在环境中经过风化的聚合物样品,也可以在没有先前清洁的情况下识别,证明广泛的应用领域用于表征和鉴定各种聚合物样品。最后,我们提出了具有这种新技术的已知和未知样品的测量和分析策略。

著录项

  • 来源
    《Analytical methods》 |2019年第40期|共8页
  • 作者单位

    Alfred Wegener Inst Helmholtz Ctr Polar &

    Marine Res Biol Anstalt Helgoland Kurpromenade 201 D-27498 Helgoland Germany;

    Alfred Wegener Inst Helmholtz Ctr Polar &

    Marine Res Biol Anstalt Helgoland Kurpromenade 201 D-27498 Helgoland Germany;

    Alfred Wegener Inst Helmholtz Ctr Polar &

    Marine Res Biol Anstalt Helgoland Kurpromenade 201 D-27498 Helgoland Germany;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 分析化学;
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