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首页> 外文期刊>Current applied physics: the official journal of the Korean Physical Society >The application of conventional photolithography to microscale organic resistive memory devices
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The application of conventional photolithography to microscale organic resistive memory devices

机译:常规光刻法在微尺度有机电阻存储器件中的应用

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摘要

We demonstrate the application of conventional photolithography to fabricate organic memory devices in an array structure with a cell area of 4 × 4 μm ~2 without damaging the underlying organic memory layer. Applying photolithography to organic electronic devices is not trivial because the solvents used during lithography may dissolve and damage the previously coated organic layers. The application of photolithography to our organic devices was possible because of the introduction of polymethyl methacrylate (PMMA)/polyvinyl alcohol (PVA) onto the memory active layer, where PMMA functions as a buffer layer to prevent dissolution of the PVA layer during developing process, and PVA acts as a striped layer during metal lift-off process. Embedded Al bottom electrodes were particularly constructed to minimize the switching failure. The completed organic memory devices exhibited typical unipolar switching behavior and excellent memory performance in terms of their statistical memory parameters (ON and OFF currents and threshold voltages), ON/OFF ratio (>10 ~2), endurance (>230 cycles), and retention (>10 ~4 s). This convenient photolithography patterning technique is applicable for the further scaling of many types of organic devices.
机译:我们证明了传统的光刻法在阵列结构中制造有机存储器件,其中电池区域为4×4μm〜2,而不会损坏下面的有机存储器层。将光刻到有机电子器件施加到有机电子器件是不普遍的,因为光刻期间使用的溶剂可以溶解并损坏预先涂覆的有机层。将光刻到我们的有机装置中的应用是可能的,因为将聚甲基丙烯酸甲酯(PMMA)/聚乙烯醇(PVA)引入存储器有源层上,其中PMMA用作缓冲层以防止在显影过程中溶解PVA层,在金属剥离过程中,PVA充当条纹层。特别构造嵌入式Al底部电极以最小化切换故障。完成的有机存储器件在其统计记忆参数(ON和OFF电流和阈值电压),开/关比(> 10〜2),耐久性(> 230周期)方面,表现出典型的单极式切换行为和出色的内存性能。保留(> 10〜4秒)。这种方便的光刻图案化技术适用于许多类型的有机装置的进一步缩放。

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