...
首页> 外文期刊>Condition Monitor >Sensors to detect micro-defects in materials under development
【24h】

Sensors to detect micro-defects in materials under development

机译:传感器以检测开发材料中的微缺陷

获取原文
获取原文并翻译 | 示例
           

摘要

Sensors that detect micro-defects in materials are being developed in the UK by the Compound Semiconductor Centre (CSC), Cardiff University's joint venture with IQE plc. Funded by Innovate UK under the UK National Quantum Technologies Programme, two new collaborations will translate quantum science into UK-based manufacturing. CSC has initiated a new £1.9 million project with partners including CST Global, Cardiff University, INEX Microtechnology, the National Physical Laboratory (NPL) and the University of Nottingham to develop a novel sensor.
机译:通过Cardiff Universy的Carrify University与IQE PLC的合资企业,在英国探测了材料中的微缺陷的传感器。 由英国国家量子技术计划创新的英国资助,两项新合作将将量子科学转化为基于英国的制造业。 CSC已启动新的190万英镑项目,其中包括CST Global,卡迪夫大学,Inex Microotechnology,国家物理实验室(NPL)和诺丁汉大学进行新颖传感器。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号