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首页> 外文期刊>ChemCatChem >Efficient BiVO4 Thin Film Photoanodes Modified with Cobalt Phosphate Catalyst and W-doping
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Efficient BiVO4 Thin Film Photoanodes Modified with Cobalt Phosphate Catalyst and W-doping

机译:高效的BIVO4薄膜光阳极改性磷酸盐催化剂和W掺杂

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摘要

Bismuth vanadate (BiVO4) thin film photoanodes for light-induced water oxidation are deposited by a low-cost and scalable spray pyrolysis method. The resulting films are of high quality, as indicated by an internal quantum efficiency close to 100% between 360 and 450nm. However, its performance under AM1.5 illumination is limited by slow water oxidation kinetics. This can be addressed by using cobalt phosphate (Co-Pi) as a water oxidation co-catalyst. Electrodeposition of 30nm Co-Pi catalyst on the surface of BiVO4 increases the water oxidation efficiency from approximate to 30% to more than 90% at potentials higher than 1.2V vs. a reversible hydrogen electrode (RHE). Once the surface catalysis limitation is removed, the performance of the photoanode is limited by low charge separation efficiency; more than 60% of the electron-hole pairs recombine before reaching the respective interfaces. Slow electron transport is shown to be the main cause of this low efficiency. We show that this can be remedied by introducing W as a donor type dopant in BiVO4, resulting in an AM1.5 photocurrent of approximate to 2.3mAcm2 at 1.23V vs. RHE for 1% W-doped Co-Pi-catalyzed BiVO4.
机译:通过低成本和可伸缩的喷雾热解方法沉积光诱导水氧化的钒酸盐(BIVO4)薄膜光膜。所得薄膜具有高质量,如在360和450nm之间的100%接近100%的内部量子效率所示。然而,它根据AM1.5照明的性能受缓慢水氧化动力学的限制。这可以通过使用磷酸盐(Co-Pi)作为水氧化助催化剂来解决。在BiVo4表面上的30nM Co-Pi催化剂的电沉积增加了在高于1.2V与可逆氢电极(RHE)的电位下从近似的水氧化效率从近似的30%到90%。一旦除去表面催化限制,光电码的性能受低电荷分离效率的限制;在达到相应的接口之前,超过60%的电子孔对重新组合。慢电子传输被证明是这种低效率的主要原因。我们表明,通过将W作为BIVO4中的供体型掺杂剂引入掺杂剂可以补救,导致AM1.5光电流在1.23V与rhe的2.3macM2的近似为1%w掺杂的Co-pi-pi-pi催化的Bivo4。

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