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A QTL associated with high seed coat cracking rate of a leading Japanese soybean variety

机译:QTL与高种子涂层开裂率相关的日本大豆品种相关联

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摘要

Seed coat cracking in soybeans [Glycine max (L). Merr.] leads to commercial and agronomic losses. The Japanese elite soybean cultivar 'Fukuyutaka' is often used as a parent for breeding, but its high rate of seed coat cracking is an obstacle to its further use in breeding programs. To establish a DNA marker-assisted selection system for seed coat cracking, genetic factors related to high rates of seed coat cracking were surveyed, and a quantitative trait locus (QTL) with a stable effect on seed coat cracking in both years of a two-year replication experiment was detected on chromosome 20. Comparison of a set of near-isogenic lines (NILs) around this locus verified that the presence of the 'Fukuyutaka' allele significantly increased seed coat cracking in the kernel. The locus is located in a genomic region spanning 3.2 Mb. Marker-assisted selection for the locus will improve the selection efficiency of 'Fukuyutaka'-derived breeding populations.
机译:大豆裂纹裂纹[甘氨酸MAX(L)。 MERR。]导致商业和农艺损失。 日本精英大豆品种“福井云达”往往被用作育种的父母,但它的种子涂层裂缝的高速率是其进一步用于育种计划的障碍。 为了建立用于种子涂层裂缝的DNA标记辅助选择系统,调查与种子涂层裂纹高速率相关的遗传因素,以及对两年内的种子涂层裂纹效果稳定的定量性状基因座(QTL) 在染色体20上检测到年份复制实验。在该基因座周围的一组近代源线(尼尔)的比较验证了“福福岛”等位基因的存在显着增加了核心裂解的种子涂层开裂。 轨迹位于跨越3.2 MB的基因组区域。 轨迹的标记辅助选择将提高“福井云达卡衍生育种人口的选择效率”。

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