首页> 外文期刊>Biometrics: Journal of the Biometric Society : An International Society Devoted to the Mathematical and Statistical Aspects of Biology >Discussion on “Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
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Discussion on “Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow

机译:浅谈“大型样品中逻辑回归模型的善良:Hosman-Lemeshow测试的修改”由Giovanni Nattino,Michael L. Pennell和Stanley Lemeshow

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