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首页> 外文期刊>Journal of Colloid and Interface Science >Removing the effect of blooming from potential energy measurement by employing total internal reflection microscopy integrated with video microscopy
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Removing the effect of blooming from potential energy measurement by employing total internal reflection microscopy integrated with video microscopy

机译:通过采用与视频显微镜集成的全内反射显微镜进行全内反射显微镜去除潜在能量测量的效果

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Total internal reflection microscopy (TIRM) measures the interactions between a colloidal particle and a flat surface in aqueous solution. Recently, TIRM has further integrated with video microscopy (VM) and enabled the simultaneous measurements of multi-particle colloid-surface interactions in the same ensemble. However, there still remain challenges about accurate image acquisition due to blooming. Blooming means the number of photons reaching the detector exceeds its maximum capacity, and the excess photons will either spill to adjacent pixels or not be counted, leading to an obstacle from precise determination of intensity. Our result shows that blooming gives rise to a deviation of the measured potential energy from the classical theory of Derjaguin, Landau, Verway, and Overbeek (DLVO). Therefore, a correction method was developed in this work to deduce the real intensity from the experimental measurement. The relationship between scattered light intensity and exposure time deviates from linearity when blooming occurs. A correction equation was developed to recover the real intensity, which was then confirmed by the accordance between the corresponding potential energy profiles and the DLVO theory. This correction method is suitable for VM systems of colloidal probes illuminated by scattered light, broadening the application of VM imaging to investigate colloidal interactions. (C) 2017 Elsevier Inc. All rights reserved.
机译:全内反射显微镜(Tirm)测量胶体颗粒与水溶液中平坦表面之间的相互作用。最近,CIRIG进一步与视频显微镜(VM)相结合,使得能够同时测量同一集合中的多粒子胶体表面相互作用。然而,由于盛开的准确图像采集仍然存在挑战。开花是指到达探测器的光子的数量超过其最大容量,并且过量的光子将溢出到相邻像素或不计数,导致精确地确定强度的障碍物。我们的结果表明,盛开的趋势导致测量的潜在能量从Derjaguin,Landau,Verway和Ovebeek(DLVO)的经典理论偏离。因此,在这项工作中开发了一种校正方法,从实验测量中推断出真正的强度。散射光强度和曝光时间之间的关系偏离盛开时的线性。开发了一种校正方程以恢复实际强度,然后通过相应的电位能量分布和DLVO理论之间确认。该校正方法适用于通过散射光照射的胶体探针的VM系统,扩大VM成像来研究胶体相互作用。 (c)2017年Elsevier Inc.保留所有权利。

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