机译:无定形IN-ZN-O薄膜晶体管的性能和稳定性,包括在低温下合成的栅极绝缘体
Department of Materials Science and Engineering Chungnam National University;
Department of Materials Science and Engineering Chungnam National University;
Department of Materials Science and Engineering Chungnam National University;
School of Integrated Technology Yonsei University;
Department of Advanced Materials Science and Engineering Hanbat National University;
Biosystems Machinery Engineering Chungnam National University;
Department of Materials Science and Engineering Korea Advanced Institute of Science and Technology;
Department of Materials Science and Engineering Chungnam National University;
In-Ga-Zn-O; Thin-film transistor; Atomic layer deposition; Gate insulator; Negative bias illumination stress; Positive bias stress;
机译:无定形IN-ZN-O薄膜晶体管的性能和稳定性,包括在低温下合成的栅极绝缘体
机译:使用门控四探针测量分析非晶In-Ga-Zn-O薄膜晶体管中随温度变化的电特性
机译:使用门控四探针测量分析非晶In-Ga-Zn-O薄膜晶体管中随温度变化的电特性
机译:高性能非晶In-Ga-Zn-O薄膜晶体管的低温高k解决方案混合栅极绝缘子
机译:用于增强离子注入薄膜和非晶混合氧化物薄膜晶体管性能的新型低温工艺。
机译:具有高性能和超薄厚度的低温可加工非晶InGaZnO薄膜晶体管的周期性脉冲湿退火方法
机译:使用微波和电子束辐射的非晶In-Zn-O半导体的低温激活,以及相关的薄膜晶体管性能