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Patterns of hardware related electrode failures in sacral nerve stimulation devices

机译:骶神经刺激装置中硬件相关电极故障的模式

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Purpose: Abnormal electrical impedance in sacral nerve stimulation devices is a cause of device failure. Currently, there is scant literature evaluating the incidence and management of this problem. We evaluated the presentation, characteristics and management of sacral nerve stimulation devices with abnormal electrical impedance. Materials and Methods: A total of 565 patients were permanently implanted with sacral nerve stimulation devices using a tined lead between 2003 and 2011. Devices were interrogated postoperatively and at followup. Abnormal electrical impedance was classified as open circuit - impedance greater than 4,000 Ω or short circuit - impedance less than 50 Ω and/or equivalence of impedance. Details on presentation, characteristics and management were recorded. Results: Of the 565 patients 72 (12.7%) experienced a total of 86 abnormal electrical impedance events, of which 57 (66.2%) were open circuits and 28 (32.5%) were short circuits. One event (1.1%) was a simultaneous open and short circuit. Short circuits presented earlier than open circuits (median 3.5 months, IQR 2-7.5 vs 15, IQR 5.5-30.5, p <0.0001) and required surgical intervention more often (75.0% vs 54.3%, p = 0.09). Patient specific factors, such as trauma history and change in body mass index class, were not associated with abnormal electrical impedance. No electrode failure patterns could be identified. Conclusions: Abnormal electrical impedance occurred in approximately 13% of cases permanently implanted in our series. Short circuits presented earlier and often required surgical intervention. Open circuits presented later and may have potentially been secondary to microfractures that accumulate with time at the sacral plate, resulting in later presentation. Almost a third of patients with abnormal electrical impedance associated with clinical inefficacy were treated conservatively, primarily with reprogramming.
机译:目的:骶神经刺激装置中的异常电阻抗是装置故障的原因。目前,有些文学评估了这个问题的发病率和管理。我们评估了具有异常电阻抗的骶神经刺激装置的呈现,特征和管理。材料和方法:使用2003年至2011年之间的骶骨神经刺激装置永久植入565名患者。术后术后和随访的装置询问。异常电阻抗被归类为开路 - 阻抗大于4,000Ω或短路 - 阻抗小于50Ω和/或阻抗等同。记录了关于演示,特征和管理的详细信息。结果:565例患者72名(12.7%)共有86例异常电阻抗事件,其中57(66.2%)是开路电路,28(32.5%)是短路。一个事件(1.1%)是一个同时打开和短路。早期呈现的短路比开路电路(中位数3.5个月,IQR 2-7.5 VS 15,IQR 5.5-30.5,P <0.0001)和所需的手术干预更常见(75.0%Vs 54.3%,P = 0.09)。患者的特定因素,如创伤史和体重指数类的变化,与电阻异常无关。可以识别电极故障模式。结论:在我们的系列中永久植入的大约13%的病例发生异常电阻抗。早期呈现的短路,经常需要手术干预。稍后呈现的开路电路可能潜在地是次要的微磨损,其在骶骨板上随时间累积,导致更晚的呈现。几乎三分之一的具有临床无效相关的电阻异常的患者守护,主要是重新编程。

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