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Edge Doping Effect to the Surface Plasmon Resonances in Graphene Nanoribbons

机译:边缘掺杂效应在石墨烯纳米中的表面等离子体共振

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In this work, we investigated the edge doping effect to graphene plasmon resonances in graphene nanoribbons (GNRs), which is known to affect the electronic doping of GNRs but has not been systematically studied. We found the Fermi levels, which reflect that the sheet charge carrier densities, extracted from the graphene plasmon resonance frequencies, vary across GNRs of different widths on the same sample. Using Raman spectroscopy, we confirmed that the variation of the sheet charge carrier density is caused by edge doping, which has a stronger effect on narrower GNRs. To further understand the edge doping effect, electron beam irradiation (EBI) is applied to modify the charge state of the edge. Using EBI, we successfully demonstrated the tuning of the graphene plasmon resonances due to the change of the edge doping states. These findings demonstrated the importance of the edge doping effect in determination of the surface plasmon frequency in GNRs.
机译:在这项工作中,我们调查了石墨烯纳米波(GNRS)中石墨烯等离子体共振的边缘掺杂效应,这已知是影响GNR的电子掺杂,但尚未得到系统研究。 我们发现从石墨烯等离子体共振频率提取的纸张电荷载体密度,在同一样品上不同宽度的GNR之间变化。 使用拉曼光谱学,我们证实了纸张电荷载体密度的变化是由边缘掺杂引起的,这对较窄的GNR具有更强的影响。 为了进一步了解边缘掺杂效果,施加电子束照射(EBI)以改变边缘的充电状态。 使用EBI,我们成功地证明了由于边缘掺杂状态的变化而调整石墨烯等离子体共振。 这些发现证明了边缘掺杂效应在GNR中测定表面等离子体频率的重要性。

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