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首页> 外文期刊>The Journal of Chemical Physics >Low energy secondary electron induced damage of condensed nucleotides
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Low energy secondary electron induced damage of condensed nucleotides

机译:低能量二次电子诱导的浓缩核苷酸损伤

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Radiation damage and stimulated desorption of nucleotides 2'-deoxyadenosine 5'-monophosphate (dAMP), adenosine 5'-monophosphate (rAMP), 2'-deoxycytidine 5'-monophosphate (dCMP), and cytidine 5'-monophosphate (rCMP) deposited on Au have been measured using x-rays as both the probe and source of low energy secondary electrons. The fluence dependent behavior of the O-1s, C-1s, and N-1s photoelectron transitions was analyzed to obtain phosphate, sugar, and nucleobase damage cross sections. Although x-ray induced reactions in nucleotides involve both direct ionization and excitation, the observed bonding changes were likely dominated by the inelastic energy-loss channels associated with secondary electron capture and transient negative ion decay. Growth of the integrated peak area for the O-1s component at 531.3 eV, corresponding to cleavage of the C-O-P phosphodiester bond, yielded effective damage cross sections of about 23 Mb and 32 Mb (1 Mb = 10(-18) cm(2)) for AMP and CMP molecules, respectively. The cross sections for sugar damage, as determined from the decay of the C-1s component at 286.4 eV and the glycosidic carbon at 289.0 eV, were slightly lower (about 20 Mb) and statistically similar for the r- and d- forms of the nucleotides. The C-1s component at 287.6 eV, corresponding to carbons in the nucleobase ring, showed a small initial increase and then decayed slowly, yielding a low damage cross section (similar to 5 Mb). Although there is no statistical difference between the sugar forms, changing the nucleobase from adenine to cytidine has a slight effect on the damage cross section, possibly due to differing electron capture and transfer probabilities. Published under license by AIP Publishing.
机译:辐射损伤和刺激核苷酸的解吸2'-脱氧腺苷5'-单磷酸盐(潮湿),腺苷5'-单磷酸(斜坡),2'-脱氧胞苷5'-单磷酸(DCMP)和沉积的胞嘧啶5'-单磷酸(RCMP)在AU上使用X射线测量,作为低能量二次电子的探针和源。分析O-1S,C-1S和N-1S和N-1S光电子转变的流量依赖性行为以获得磷酸盐,糖和核碱基损伤横截面。尽管核苷酸中的X射线诱导反应涉及直接电离和激发,但是观察到的粘合变化可能由与二次电子捕获和瞬态负离子衰减相关的无弹性能量损耗通道来构成。 O-1S组分的综合峰面积的生长在531.3eV中,对应于COP磷酸二酯键的切割,产生约23mb和32mb(1mb = 10(-18)cm(2)的有效损伤横截面)分别用于AMP和CMP分子。从286.4eV的C-1S组分的衰减中确定的糖损伤的横截面和289.0eV的甘油酸碳,略低于(约20mb),并且统计学上类似的r-和d-形式核苷酸。在287.6eV中的C-1S组分,对应于核碱酶环中的碳,表现出小的初始增加,然后缓慢衰减,产生低损伤横截面(类似于5 MB)。虽然糖形式之间没有统计学差异,但是从腺嘌呤到胞苷的核碱基对胞苷对损伤的横截面有轻微影响,可能是由于不同的电子捕获和转移概率。通过AIP发布在许可证下发布。

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