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首页> 外文期刊>Physica, C. Superconductivity and its applications >Tuning of the defect mode in a 1D superconductor-semiconductor crystal with hydrostatic pressure dependent frequency of the transverse optical phonons
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Tuning of the defect mode in a 1D superconductor-semiconductor crystal with hydrostatic pressure dependent frequency of the transverse optical phonons

机译:在横光学声子的静压压力相关频率的1D超导体半导体晶体中调谐缺陷模式

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This study aims to investigate a transmittance spectrum in a one-dimensional photonic crystal, which is surrounded by air and composed of alternating layers of a superconductor O and a semiconductor (GaAs), using the transfer matrix and two-fluid models. Herein, we considered the pressure-dependence of the superconductor's critical temperature and the pressure-dependence, in the semiconductor, in both the angular frequency of the transverse optical phonons and the thickness of layers. Initially, we found that increasing the pressure for fixed thickness values of the superconductor results in a shift in the larger frequencies of the transmittance spectrum and the photonic band gaps. With an increase in the thickness of the superconductor layer at a fixed pressure and thickness values of the semiconductor, an increase in the width of the photonic band gaps was observed. When a defective GaAs semiconductor layer was inserted into the structure due to the dissipative features of the semiconductor, a defective mode with a transmittance of less than 1.0 was found inside the photonic band gaps. When the thickness of the superconductor layer was increased, while keeping the pressure and thickness of the semiconductor constant, the defect mode shifted to shorter frequencies. It was also found that the shift and the number of defective modes in the photonic band gaps increase when the thickness of the defective semiconductor layer increases.
机译:本研究旨在调查在一维光子晶体,这是由空气包围和超导体O和上半导体(GaAs)的交替层构成的,利用传递矩阵和双流体模型的透射率光谱。在此,我们认为是超导体的临界温度的压力依存性和压力的依赖性,在半导体,在横向光学声子的两端的角频率和层的厚度。最初,我们发现,增加在透射光谱的较大频率和光子带隙的移位超导体结果的固定厚度值的压力。用在固定的压力的增加超导层的厚度和半导体的厚度值,观察到的增加光子带隙的宽度。当有缺陷的GaAs半导体层插入结构,由于半导体的耗散特征,具有小于1.0的透射率的不良模式被发现在光子带隙内。当超导体层的厚度增加,同时保持半导体恒定的压力和厚度,缺陷模式转移到更短的频率。还发现的是,移位和在光子带隙缺陷模式的数量增加时的有缺陷的半导体层的厚度增加。

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