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首页> 外文期刊>Sensors and Actuators, A. Physical >Direct current-induced breakdown to enhance reproducibility and performance of carbon-based interdigitated electrode arrays for AC electroosmotic micropumps
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Direct current-induced breakdown to enhance reproducibility and performance of carbon-based interdigitated electrode arrays for AC electroosmotic micropumps

机译:直接电流诱导的击穿,提高AC电软渗透微型泵的基于碳基的互联电极阵列的再现性和性能

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摘要

The conventional fabrication process of carbon-based microelectromechanical systems (C-MEMS) often yields undesired carbon residues that reduce the reproducibility and performance of final structures by establishing unwanted electrical connections. In this work, we present a new and straightforward method based on the application of a low direct current (DC) to effectively remove the undesired electrical connections. The DC bias causes the breakdown and removal of the short-circuiting carbon residue due to Joule heating, resulting in significantly enhanced performance and reproducibility of the final structures. We fabricated carbon-based asymmetric coplanar interdigitated electrode arrays (IDEAs) for alternating current electroosmotic (ACEO) micropumps using the conventional Carbon-MEMS process. By scanning electron microscopy (SEM); Raman, energy dispersive X-ray (EDX) spectroscopies; four-point probe resistance measurements; and the combination of ion-beam etching and X-ray photoelectron spectroscopy (XPS), we confirmed the presence of residual, carbon in the gaps of the IDEAs and established its deleterious effect on electrical properties of the structures and their performance as electrodes in-micropumps. A computational study was also conducted to estimate the temperature increase due to the DC bias applied across a thin residual carbon. Experimentally, we found that the DC-treated IDEAs exhibited more than double the fluid velocity in ACEO pumping compared to untreated devices; and also, the coefficient of variation of the fluid velocity for the DC-treated ACED micropumps was significantly smaller than that for the untreated ones. This simple and easy-to-implement method can substantially improve the yield of Carbon-MEMS manufacturing, leading to a highly reproducible production of high performance carbon electronic circuits and microstructures. (C) 2017 Elsevier B.V. All rights reserved.
机译:碳基微机电系统(C-MEMS)的常规制造过程通常通过建立不需要的电连接来降低最终结构的再现性和性能的不希望的碳残留物。在这项工作中,我们提出了一种基于应用低直流(DC)的新的和简单方法,以有效地消除不需要的电气连接。直流偏压导致由于焦耳加热引起短路碳残留物的击穿和去除,导致最终结构的性能和再现性显着提高。我们使用传统的碳-MEMS工艺制造用于交流电流(ACEO)微泵的碳基的不对称共面共轭电极阵列(思想)。通过扫描电子显微镜(SEM);拉曼,能量分散X射线(EDX)光谱;四点探测电阻测量;和离子束蚀刻和X射线光电子谱(XPS)的组合,我们确认存在残留的碳,在思想的间隙中,并确定了其对结构的电气性质及其作为电极的性能的有害影响。微泵。还进行计算研究以估计由于施加在薄残留碳上的DC偏压而增加的温度增加。实验,我们发现与未处理的装置相比,DC处理的想法表现出在Aceo泵送中的流体速度的两倍多;而且,DC处理的ACED Micropumps的流体速度的变化系数显着小于未处理的Micropumps的变化。这种简单易于实现的方法可以大大提高碳 - MEMS制造的产量,导致高性能碳电子电路和微观结构的高度可再现生产。 (c)2017年Elsevier B.V.保留所有权利。

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